Non-Destructive Mobility System
Stop wasting $$ on Hall wafers and lost reactor time.

Model 1610E025

Model 1610P30

LEI's contactless mobility system eliminates the need for time-consuming sample preparation, and permits characterization of actual product wafers.

Applications
-Compound semiconductors

Measurement parameters
-Mobility
-Sheet resistance
-Sheet charge

System features
-Computerized control and data
 logging routines for calibration,
 setup and run
-Typical range of capability up to
 20,000 cm²/V-s

Download the full .pdf version of the LEI 1600 brochure here. Download 1600 ad.   New Model 1610P030SF brochure