Hg Probe

Hg Probe

Applications

• Conductive substrates (Model 2017) –

• Semi-insulating substrates (Model 2017B) –

• Test sample size from 6.4 mm x 6.4 mm
(.25″x.25″) to 150 mm (6″) wafers standard models)

System Features –

• Permanent machined orifice plate
(no mylar replacement) –

• Minimal series resistance via innovative Schottky/return dot configuration

• Precision vacuum control

• Unique vacuum Hg-pull/sample hold-down configuration improves repeatability of the
mercury Schottky

 

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