Model 1616AM / 1618AM

Model 1616AM / 1618AM

  • The contactless, non-destructive alternative to Hall mobility
  • Automated mapping and positioning
  • Reduce costs because no need to destroy expensive wafers
  • Provide instant feedback
  • Rapid return on investment
  • Eliminate the need for time consuming sample preparation
  • Reduce measurement time from hours to minutes for a full wafer map vs van der Pauw Hall technique
  • Obtain fast and accurate reading of sheet resistance, mobility, & carrier density
  • NO wafer cleave, NO ohmic contact, NO annealing contact
  • Mobility: 600 – 20,000 cm2/v-sec
  • Reversible permanent magnet allows for greater measurement precision
  •  (Model 1618AM ONLY) Sheet Resistance: 15 – 3,000 ohms/sq. using eddy current technology (other ranges also available)
TOP